《IPC/JEDEC J-STD-020》
《IPC/JEDEC J-STD-035》
Customers provide or suggest using standards

《IPC/JEDEC J-STD-020》
《IPC/JEDEC J-STD-035》
Customers provide or suggest using standards
Sample preparation ⇒ Confirm sample type ⇒ Select frequency probe ⇒ Select scanning mode ⇒ Observation record ⇒ Result evaluation
Testing requirements:
Ultrasonic microscopy analysis technology, by emitting and receiving ultrasonic signals, can distinguish the differences in internal acoustic impedance of materials, as well as defects such as voids or delamination in various layers of components, through image and acoustic contrast without damaging the chip.
Key inspection requirements: layering, bubbles, defect localization